US-based Able Electropolishing has added a fourth-generation scanning electron microscope (SEM) to its product lineup, to provide customers in the EV manufacturing industry access to in-house analytic and testing capabilities.
The JCM-7000 NeoScopeä Benchtop SEM features a platform for applications from measurement and analysis of surface defects to elemental analysis. The SEM offers part magnification up to 100,000x using a high-resolution W filament source and a combination of secondary and backscatter electron (BSE) detectors alongside high and low vacuum modes to analyze a range of sample types and sizes.
The JCM-7000 joins a suite of other in-house analytic tools that include a digital microscope and a 3D surface profile to enable manufacturers of increasingly sophisticated metal parts to see the effects of metal polishing on their parts in comprehensive detail.
“The ability to provide in-house analytic testing and reporting is a great benefit to our customers, eliminating the extra step of having to contract with outside laboratories and also providing insight and validation of the electropolishing services we provide,” Able President Brian Glass said.
Source: Able Electropolishing
